Prof. Piero Baraldi
Politecnico di Milano, Italy
Prof. Jingjing He
Beihang University, China
Prof. Radek Martinek
VSB – Technical University of Ostrava, Czech Republic
Dr. Jason Riggs
The American Society for Nondestructive Testing, Inc, USA
Prof. Dong Wang
Shanghai Jiao Tong University, China
Prof. Ruqiang Yan
Xi’an Jiaotong University, China